Auflicht und Durchlicht Systeme  / EN



System structure
Depending on the product and the to be inspected areas with defects, different basic systems/assembly variants will be installed. In this context, MRP makes the following distinctions:

  • Transmitted light inspection
  • Incident light inspection
  • Transmitted and incident light inspection

The assembly variants enable illumination arrangements for light and dark field.
Generally line scan cameras with resolutions of 2048 or 4096 pixels are used for image recording. Aperture fluorescent tubes, UV-fluorescent tubes or LED luminaries with different wave lengths (white light, blue light, red light or infrared) are available for illumination purposes. Based on the task definition, we select the best possible attuned system of camera - and lighting.
Gigabit Ethernet connects the line scan cameras to the camera computer, which detects and classifies the defective areas based on the transferred image information. The defective areas are displayed and ar-chived according to customer specification by the master computer. Service functions and parametrisations are also possible.
An automatic control of the light intensity enables consistent inspection performance regardless of the age-ing of the lamps, of dust and dirt or changes of the product opacity, e.g. in the case of change of varieties.

If required, the defective areas can be marked at the face side by a labelling device or a printer can be marked. Alternatively or additionally, a transfer of the defective areas to a subsequent processing machine (e.g. rewinder) is also possible. Thus, so-called target systems can be implemented.
MRP-WIS2008 has a modular design and can be installed as a client/server structure. Thus, multiple oper-ator stations are possible. Furthermore, remote access from any internet workstation is also possible.
* In our laboratory, we gladly perform a free sample examination with logging of your defective areas. This feasibility analysis represents the basis of the functional guarantee for an inspection system to be installed at a later stage.